NI conference for more productive manufacturing

11 May 2009

National Instruments Corporation (UK) Ltdvisit website


National Instruments has announced plans for its 15th annual graphical system design conference and exhibition that attracts more than 3000 engineers, educators and scientists.

NIWeek 2009 will run from August 4-6 at the Austin Convention Centre, Austin, Texas, and provide three full days of technical sessions, hands-on workshops, targeted summits and interactive exhibitions on the latest developments for design, control, automation, manufacturing and test. The conference also features keynote presentations and product demonstrations that explore how engineers and scientists can use cost-efficient and flexible technologies to boost productivity and lower costs.

“NIWeek is a one-of-a-kind opportunity for engineers and scientists to explore the latest technologies for design, control and test; exchange ideas with colleagues from around the world; and develop new skills that will make their companies more competitive, which is especially important in these challenging times,” said Dr. James Truchard, NI CEO, President and Cofounder.

“At NIWeek 2009, we will look at how the versatility of the graphical system design platform gives engineers and scientists a cost-effective way to make dramatic improvements to their applications.”

Skills for retaining competitiveness

There will be more than 200 technical sessions from companies and universities such as Averna, Harris Corporation, Freescale Semiconductor and Purdue University. These sessions will highlight the latest developments in test and data acquisition, industrial measurements and control, embedded design and software development techniques, as well as equip engineers and scientists with the skills they need to remain competitive in development and business practices. In addition, the conference offers the first ever NIWeek Military and Aerospace Summit, along with technical summits on RF and wireless communications, vision and robotics.

Attendees can learn about new technologies and view product demonstrations at more than 200 booths at the NIWeek 2009 exhibition. The exhibition hall features the technologies discussed during the keynote presentations and technical summits in areas such as the LabVIEW Zone and the RF and Wireless Pavilion. The conference also hosts networking events such as daily Peer2Peer Roundtables, which provide opportunities for attendees to discuss best practices with their peers and NI developers for a specific application, job position or industry.

More information is available at

National Instruments Corporation (UK) Ltdvisit website
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